HAYASHI, Victor Takashi, RIBEIRO, Cairo Mateus Neves, FILHO, Artino Quintino, PITA, Matheus Ancelmo Bonfim, TRAZZI, Bruno Manias, ESTRELLA, Julio Cezar und RUGGIERO, Wilson Vicente, 2021. Improving Io T Module Testability with Test-Driven Development and Machine Learning. In: . 1 August 2021.
Elsevier - Harvard (with titles)Hayashi, V.T., Ribeiro, C.M.N., Filho, A.Q., Pita, M.A.B., Trazzi, B.M., Estrella, J.C., Ruggiero, W.V., 2021. Improving Io T Module Testability with Test-Driven Development and Machine Learning, in: . https://doi.org/10.1109/Fi Cloud49777.2021.00066
American Psychological Association 7th editionHayashi, V. T., Ribeiro, C. M. N., Filho, A. Q., Pita, M. A. B., Trazzi, B. M., Estrella, J. C., & Ruggiero, W. V. (2021, August 1). Improving Io T Module Testability with Test-Driven Development and Machine Learning. https://doi.org/10.1109/Fi Cloud49777.2021.00066
Springer - Basic (author-date)Hayashi VT, Ribeiro CMN, Filho AQ, Pita MAB, Trazzi BM, Estrella JC, Ruggiero WV (2021) Improving Io T Module Testability with Test-Driven Development and Machine Learning
Juristische Zitierweise (Stüber) (Deutsch)Hayashi, Victor Takashi/ Ribeiro, Cairo Mateus Neves/ Filho, Artino Quintino/ Pita, Matheus Ancelmo Bonfim/ Trazzi, Bruno Manias/ Estrella, Julio Cezar/ Ruggiero, Wilson Vicente, Improving Io T Module Testability with Test-Driven Development and Machine Learning, 2021, .