Treffer: Improving IoT Module Testability with Test-Driven Development and Machine Learning

Title:
Improving IoT Module Testability with Test-Driven Development and Machine Learning
Authors:
Hayashi, Victor Takashi, Ribeiro, Cairo Mateus Neves, Filho, Artino Quintino, Pita, Matheus Ancelmo Bonfim, Trazzi, Bruno Manias, Estrella, Julio Cezar, Ruggiero, Wilson Vicente
Source:
2021 8th International Conference on Future Internet of Things and Cloud (FiCloud) FICLOUD Future Internet of Things and Cloud (FiCloud), 2021 8th International Conference on. :406-412 Aug, 2021
Relation:
2021 8th International Conference on Future Internet of Things and Cloud (FiCloud)
Database:
IEEE Xplore Digital Library