GHAZAVI, Sanaz, ABDULRAZZAQ, Ali Kareem, MAYER, Franziska, SCHOTT, Christian, MARKERT, Erik und HEINKEL, Ulrich, 2025. Towards Model-Driven Circuit Test Development: Sys MLv2-Based Test Modeling and Assisted Workflow. In: . 8 April 2025.
Elsevier - Harvard (with titles)Ghazavi, S., Abdulrazzaq, A.K., Mayer, F., Schott, C., Markert, E., Heinkel, U., 2025. Towards Model-Driven Circuit Test Development: Sys MLv2-Based Test Modeling and Assisted Workflow, in: . https://doi.org/10.1109/SSI65953.2025.11107217
American Psychological Association 7th editionGhazavi, S., Abdulrazzaq, A. K., Mayer, F., Schott, C., Markert, E., & Heinkel, U. (2025, April 8). Towards Model-Driven Circuit Test Development: Sys MLv2-Based Test Modeling and Assisted Workflow. https://doi.org/10.1109/SSI65953.2025.11107217
Springer - Basic (author-date)Ghazavi S, Abdulrazzaq AK, Mayer F, Schott C, Markert E, Heinkel U (2025) Towards Model-Driven Circuit Test Development: Sys MLv2-Based Test Modeling and Assisted Workflow
Juristische Zitierweise (Stüber) (Deutsch)Ghazavi, Sanaz/ Abdulrazzaq, Ali Kareem/ Mayer, Franziska/ Schott, Christian/ Markert, Erik/ Heinkel, Ulrich, Towards Model-Driven Circuit Test Development: Sys MLv2-Based Test Modeling and Assisted Workflow, 2025, .