• Towards Model-Driven Circuit T...

Treffer: Towards Model-Driven Circuit Test Development: SysMLv2-Based Test Modeling and Assisted Workflow

Title:
Towards Model-Driven Circuit Test Development: SysMLv2-Based Test Modeling and Assisted Workflow
Authors:
Ghazavi, Sanaz, Abdulrazzaq, Ali Kareem, Mayer, Franziska, Schott, Christian, Markert, Erik, Heinkel, Ulrich
Source:
2025 Smart Systems Integration Conference and Exhibition (SSI) Smart Systems Integration Conference and Exhibition (SSI), 2025. :1-7 Apr, 2025
Relation:
2025 Smart Systems Integration Conference and Exhibition (SSI)
Database:
IEEE Xplore Digital Library