KOTESHWAR, A., HOQUE, S., DEB, D. und GOSWAMI, R., 2026. Interface Segmentation Approach (In Se Ap) on TCAD for Statistical Analysis of Interface Trap Spatial Variations in TFETs. IEEE Access, Access, IEEE. 1 Januar 2026. Vol. 14, , p. 11149-11162. DOI 10.1109/ACCESS.2026.3654230.
Elsevier - Harvard (with titles)Koteshwar, A., Hoque, S., Deb, D., Goswami, R., 2026. Interface Segmentation Approach (In Se Ap) on TCAD for Statistical Analysis of Interface Trap Spatial Variations in TFETs. IEEE Access, Access, IEEE 14, 11149-11162. https://doi.org/10.1109/ACCESS.2026.3654230
American Psychological Association 7th editionKoteshwar, A., Hoque, S., Deb, D., & Goswami, R. (2026). Interface Segmentation Approach (In Se Ap) on TCAD for Statistical Analysis of Interface Trap Spatial Variations in TFETs. IEEE Access, Access, IEEE, 14, 11149-11162. https://doi.org/10.1109/ACCESS.2026.3654230
Springer - Basic (author-date)Koteshwar A, Hoque S, Deb D, Goswami R (2026) Interface Segmentation Approach (In Se Ap) on TCAD for Statistical Analysis of Interface Trap Spatial Variations in TFETs. IEEE Access, Access, IEEE 14:11149-11162. https://doi.org/10.1109/ACCESS.2026.3654230
Juristische Zitierweise (Stüber) (Deutsch)Koteshwar, A./ Hoque, S./ Deb, D./ Goswami, R., Interface Segmentation Approach (In Se Ap) on TCAD for Statistical Analysis of Interface Trap Spatial Variations in TFETs, IEEE Access, Access, IEEE 2026, 11149-11162.