• Efficient Visual Inspection Fr...

Treffer: Efficient Visual Inspection Framework of High-Bandwidth Memory Bumps with Generative and Deep Learning AI

Title:
Efficient Visual Inspection Framework of High-Bandwidth Memory Bumps with Generative and Deep Learning AI
Authors:
Chang, Richard, Wang, Jie, Chong, Ser Choong, Yang, Xulei, Pahwa, Ramanpreet Singh
Source:
2025 IEEE 75th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2025 IEEE 75th. :920-926 May, 2025
Relation:
2025 IEEE 75th Electronic Components and Technology Conference (ECTC)
Database:
IEEE Xplore Digital Library