Treffer: Unlocking the Potential of Dynamic Languages: An Exploration of Automated Unit Test Generation Techniques
Title:
Unlocking the Potential of Dynamic Languages: An Exploration of Automated Unit Test Generation Techniques
Authors:
Source:
2023 IEEE International Conference On Artificial Intelligence Testing (AITest) AITEST Artificial Intelligence Testing (AITest), 2023 IEEE International Conference On. :122-126 Jul, 2023
Relation:
2023 IEEE International Conference On Artificial Intelligence Testing (AITest)
Database:
IEEE Xplore Digital Library