CATALUCCI, Sofia und SAVIO, Enrico, 2026. Metrological validation of a deep learning pipeline for in-line detection and dimensional quantification of three-dimensional surface defects. CIRP: Journal of Manufacturing Science & Technology. 1 Februar 2026. Vol. 64, , p. 107-119. DOI 10.1016/j.cirpj.2025.12.002.
Elsevier - Harvard (with titles)Catalucci, S., Savio, E., 2026. Metrological validation of a deep learning pipeline for in-line detection and dimensional quantification of three-dimensional surface defects. CIRP: Journal of Manufacturing Science & Technology 64, 107-119. https://doi.org/10.1016/j.cirpj.2025.12.002
American Psychological Association 7th editionCatalucci, S., & Savio, E. (2026). Metrological validation of a deep learning pipeline for in-line detection and dimensional quantification of three-dimensional surface defects. CIRP: Journal of Manufacturing Science & Technology, 64, 107-119. https://doi.org/10.1016/j.cirpj.2025.12.002
Springer - Basic (author-date)Catalucci S, Savio E (2026) Metrological validation of a deep learning pipeline for in-line detection and dimensional quantification of three-dimensional surface defects.. CIRP: Journal of Manufacturing Science & Technology 64:107-119. https://doi.org/10.1016/j.cirpj.2025.12.002
Juristische Zitierweise (Stüber) (Deutsch)Catalucci, Sofia/ Savio, Enrico, Metrological validation of a deep learning pipeline for in-line detection and dimensional quantification of three-dimensional surface defects., CIRP: Journal of Manufacturing Science & Technology 2026, 107-119.