HA, Taewon, HWANG, Chaeseon und JEONG, Jongpil, 2026. CLIP-MDC: CLIP encoder based multimodal defect classification with synthetic anomaly generation for real-time surface defect detection. Journal of Intelligent Manufacturing. 17 Januar 2026. P. 1-1. DOI 10.1007/s10845-025-02773-4.
Elsevier - Harvard (with titles)Ha, T., Hwang, C., Jeong, J., 2026. CLIP-MDC: CLIP encoder based multimodal defect classification with synthetic anomaly generation for real-time surface defect detection. Journal of Intelligent Manufacturing 1-1. https://doi.org/10.1007/s10845-025-02773-4
American Psychological Association 7th editionHa, T., Hwang, C., & Jeong, J. (2026). CLIP-MDC: CLIP encoder based multimodal defect classification with synthetic anomaly generation for real-time surface defect detection. Journal of Intelligent Manufacturing, 1-1. https://doi.org/10.1007/s10845-025-02773-4
Springer - Basic (author-date)Ha T, Hwang C, Jeong J (2026) CLIP-MDC: CLIP encoder based multimodal defect classification with synthetic anomaly generation for real-time surface defect detection.. Journal of Intelligent Manufacturing 1-1. https://doi.org/10.1007/s10845-025-02773-4
Juristische Zitierweise (Stüber) (Deutsch)Ha, Taewon/ Hwang, Chaeseon/ Jeong, Jongpil, CLIP-MDC: CLIP encoder based multimodal defect classification with synthetic anomaly generation for real-time surface defect detection., Journal of Intelligent Manufacturing 2026, 1-1.