ZHU, Xiaoke, ZHANG, Tao, CHEN, Xiaopan, LI, Zhiqiang und JING, Xiao-Yuan, 2026. Line-level defect prediction based on preceding line-aware and inter-line semantics enhancement. Information & Software Technology. 1 März 2026. Vol. 191, , p. N.PAG-0. DOI 10.1016/j.infsof.2025.107993.
Elsevier - Harvard (with titles)Zhu, X., Zhang, T., Chen, X., Li, Z., Jing, X.-Y., 2026. Line-level defect prediction based on preceding line-aware and inter-line semantics enhancement. Information & Software Technology 191, N.PAG-0. https://doi.org/10.1016/j.infsof.2025.107993
American Psychological Association 7th editionZhu, X., Zhang, T., Chen, X., Li, Z., & Jing, X.-Y. (2026). Line-level defect prediction based on preceding line-aware and inter-line semantics enhancement. Information & Software Technology, 191, N.PAG-0. https://doi.org/10.1016/j.infsof.2025.107993
Springer - Basic (author-date)Zhu X, Zhang T, Chen X, Li Z, Jing X-Y (2026) Line-level defect prediction based on preceding line-aware and inter-line semantics enhancement.. Information & Software Technology 191:N.PAG-0. https://doi.org/10.1016/j.infsof.2025.107993
Juristische Zitierweise (Stüber) (Deutsch)Zhu, Xiaoke/ Zhang, Tao/ Chen, Xiaopan/ Li, Zhiqiang/ Jing, Xiao-Yuan, Line-level defect prediction based on preceding line-aware and inter-line semantics enhancement., Information & Software Technology 2026, N.PAG-0.