JIN, Haochen, CUI, Zhanqi, ZHANG, Ruichen, CHEN, Xiang, WANG, Rongcun und LIU, Xiulei, 2026. Defect prediction guided greybox fuzz testing. Journal of Systems & Software. 1 Januar 2026. Vol. 231, , p. N.PAG-0. DOI 10.1016/j.jss.2025.112609.
Elsevier - Harvard (with titles)Jin, H., Cui, Z., Zhang, R., Chen, X., Wang, R., Liu, X., 2026. Defect prediction guided greybox fuzz testing. Journal of Systems & Software 231, N.PAG-0. https://doi.org/10.1016/j.jss.2025.112609
American Psychological Association 7th editionJin, H., Cui, Z., Zhang, R., Chen, X., Wang, R., & Liu, X. (2026). Defect prediction guided greybox fuzz testing. Journal of Systems & Software, 231, N.PAG-0. https://doi.org/10.1016/j.jss.2025.112609
Springer - Basic (author-date)Jin H, Cui Z, Zhang R, Chen X, Wang R, Liu X (2026) Defect prediction guided greybox fuzz testing.. Journal of Systems & Software 231:N.PAG-0. https://doi.org/10.1016/j.jss.2025.112609
Juristische Zitierweise (Stüber) (Deutsch)Jin, Haochen/ Cui, Zhanqi/ Zhang, Ruichen/ Chen, Xiang/ Wang, Rongcun/ Liu, Xiulei, Defect prediction guided greybox fuzz testing., Journal of Systems & Software 2026, N.PAG-0.