CHENG, Yun, LI, Huawei, WANG, Ying und LI, Xiaowei, 2019. Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. 1 April 2019. Vol. 38, no. 4, p. 767-779. DOI 10.1109/TCAD.2018.2818690.
Elsevier - Harvard (with titles)Cheng, Y., Li, H., Wang, Y., Li, X., 2019. Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 38, 767-779. https://doi.org/10.1109/TCAD.2018.2818690
American Psychological Association 7th editionCheng, Y., Li, H., Wang, Y., & Li, X. (2019). Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 38(4), 767-779. https://doi.org/10.1109/TCAD.2018.2818690
Springer - Basic (author-date)Cheng Y, Li H, Wang Y, Li X (2019) Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug.. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 38:767-779. https://doi.org/10.1109/TCAD.2018.2818690
Juristische Zitierweise (Stüber) (Deutsch)Cheng, Yun/ Li, Huawei/ Wang, Ying/ Li, Xiaowei, Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug., IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 2019, 767-779.