LIU, Wangshu, LIU, Shulong, GU, Qing, CHEN, Jiaqiang, CHEN, Xiang und CHEN, Daoxu, 2016. Empirical Studies of a Two-Stage Data Preprocessing Approach for Software Fault Prediction. IEEE Transactions on Reliability. 1 März 2016. Vol. 65, no. 1, p. 38-53. DOI 10.1109/TR.2015.2461676.
Elsevier - Harvard (with titles)Liu, W., Liu, S., Gu, Q., Chen, J., Chen, X., Chen, D., 2016. Empirical Studies of a Two-Stage Data Preprocessing Approach for Software Fault Prediction. IEEE Transactions on Reliability 65, 38-53. https://doi.org/10.1109/TR.2015.2461676
American Psychological Association 7th editionLiu, W., Liu, S., Gu, Q., Chen, J., Chen, X., & Chen, D. (2016). Empirical Studies of a Two-Stage Data Preprocessing Approach for Software Fault Prediction. IEEE Transactions on Reliability, 65(1), 38-53. https://doi.org/10.1109/TR.2015.2461676
Springer - Basic (author-date)Liu W, Liu S, Gu Q, Chen J, Chen X, Chen D (2016) Empirical Studies of a Two-Stage Data Preprocessing Approach for Software Fault Prediction.. IEEE Transactions on Reliability 65:38-53. https://doi.org/10.1109/TR.2015.2461676
Juristische Zitierweise (Stüber) (Deutsch)Liu, Wangshu/ Liu, Shulong/ Gu, Qing/ Chen, Jiaqiang/ Chen, Xiang/ Chen, Daoxu, Empirical Studies of a Two-Stage Data Preprocessing Approach for Software Fault Prediction., IEEE Transactions on Reliability 2016, 38-53.